Calculation of Secondary Electron Emission Yield From MgO Surface

Secondary electron emission yield values for rare-gas particles (He, Ne, Ar, Kr, and Xe ions of atoms and molecules, metastable atoms, and excimers) of MgO deposited under optimum conditions for the highest values were calculated assuming the Auger transitions between the valence band, and the (oxygen ion vacancy + two electrons) and + (oxygen ion vacancy + one electron) centers in the MgO surface. These calculated values are probably the same as values for MgO used in practice. As for combination of the MgO with these rare-gas particles, all the calculated values fall to nonzero; resonance neutralization cannot occur for the rare-gas particles except Ne and Xe2 ions. Therefore, values of the MgO for these rare-gas particles, other than Ne and Xe2 ions, are determined only by Auger neutralization. For Ne and Xe2 ions, the influence of resonance neutralization effect on calculated values of ions is small. Therefore, values of the MgO for Ne and Xe2 ions are also almost determined only by Auger neutralization. The values for the ions of atoms are a little larger than those for the ions of molecules. The values of the metastable atoms are also a little larger than those of the excimers. As for MgO without defect states, calculated values of Ar, Kr, and Xe ions of atoms and molecules fall to zero; calculated value of Xe2 excimer at the lowest continuous spectrum also falls to zero; these calculated values for MgO without defect states are probably the lowest values theoretically. As for rare-gas ions of atoms, the calculated values have been compared with experimental results reported previously. These results will be useful in detailed investigations into the mechanism of discharge of plasma display panels (PDPs).